GaAs · GaN · SiC · InP Material Portfolio
1.4–3.4 eV Bandgap Range
2″–150mm Diameter Range
Epi-Ready Surface Standard

Why Compound Semiconductors?

While silicon dominates volume CMOS manufacturing, compound semiconductors enable device performance that silicon simply cannot match — higher electron mobility (GaAs: 6× Si), wider bandgaps (GaN: 3.4 eV, SiC: 3.26 eV), direct bandgap emission (InP, GaAs), and superior thermal conductivity (SiC: 3× Si).

These properties make compound substrates essential for 5G/mmWave RF front-ends, high-voltage power conversion, datacom photonics, LiDAR illumination, and satellite communication. GINECHIP supplies epi-ready compound semiconductor substrates with full characterization data for production and R&D environments.

Material Portfolio

GaAs (Gallium Arsenide)

Direct bandgap III-V semiconductor with 6× electron mobility of silicon. Dominant substrate for RF power amplifiers, pHEMT switches, and 850nm VCSELs.

Semi-insulating (≥10⁷ Ω·cm)N-type Si-dopedP-type Zn-dopedDiameters: 100mm, 150mmEPD < 5×10³/cm²

GaN-on-SiC

Gallium Nitride epitaxial layers on semi-insulating SiC substrates. The gold standard for high-power RF HEMTs and 5G mmWave front-end modules.

SiC polytype: 4H, 6HGaN thickness: 0.5–3μmAlGaN barrier: 15–30nmSheet resistance < 400 Ω/sqDiameters: 100mm, 150mm

SiC (Silicon Carbide)

Wide-bandgap (3.26 eV) semiconductor with 3× the thermal conductivity of silicon. Enables >650V power MOSFETs and Schottky barrier diodes.

Polytypes: 4H, 6HN-type, semi-insulatingMicropipe density < 1/cm²Diameters: 100mm, 150mmEpi-ready surfaces available

InP (Indium Phosphide)

III-V compound with lattice-matched properties for InGaAs/InAlAs heterostructures. Essential for photonics: DFB lasers, APD detectors, and HBT transistors.

Semi-insulating (Fe-doped)N-type S-dopedP-type Zn-dopedDiameters: 2″, 3″, 4″, 6″EPD < 5×10⁴/cm²

GaN-on-Sapphire

Cost-effective platform for LED manufacturing. GaN epitaxy on sapphire substrates for blue/green/white LEDs and microLED displays.

C-plane sapphire (0001)GaN thickness: 2–6μmPSS (Patterned Sapphire)Diameters: 2″, 4″, 6″Dicing and back-grinding available

GaSb / InAs (Antimonides)

Narrow-bandgap III-V semiconductors for mid-IR photodetectors, thermophotovoltaics, and high-speed quantum cascade lasers. Custom ingot growth on request.

GaSb: N-type (Te), P-type (Zn)InAs: N-type (S, Se)Diameters: 2″, 3″Custom orientation availableLow EPD grades for detectors

Comparative Properties

PropertySiGaAs4H-SiCGaNInP
Bandgap (eV)1.121.423.263.391.34
Electron Mobility (cm²/V·s)1,4008,5001,0001,2505,400
Critical Field (MV/cm)0.30.42.83.30.5
Thermal Conductivity (W/cm·K)1.50.554.91.30.68
Max Operating Temp (°C)150200600+400200
Lattice Constant (Å)5.4315.6533.0733.1895.869

Typical values at 300K. Custom specifications may vary by supplier. Contact us for exact lot-specific data.

Surface Quality & Polishing

All compound substrates are delivered in epi-ready condition — chemically-mechanically polished (CMP) to sub-nanometer RMS roughness, with controlled surface oxide and particle count verified per lot. For GaAs and InP wafers, we offer both polished (undoped epi-ready) and etched (post-epitaxial layer removal) surfaces.

Quality Assurance

Every incoming lot undergoes incoming QC inspection including: XRD rocking curve (FWHM) for crystal quality, Nomarski/optical microscopy for surface defects, Hall-effect measurement for electrical properties, and profilometry for TTV/Bow/Warp. Certificates of Conformance are provided with every shipment.

Need Compound Semiconductor Substrates?

Specify your material, diameter, doping, and quantity — our engineers will provide a detailed quotation within 24 hours.

ISO 9001:2015 SEMI Standards Epi-Ready Lot Traceability